Our DFT Services Include
Quantic Silicon, specializes in offering complete design for test (DFT) solutions in order to facilitate effective testing and diagnostics of semiconductor designs. Our DFT services are designed to improve test coverage, reduce test expenses, and expedite the entire testing procedure.
- Scan chains insertion and ATPG: To enable effective testing, we incorporate scan chains into your designs. In order to create test patterns with excellent fault coverage, our engineers also create Automated Test Pattern Generation (ATPG) approaches.
- Integration of built-in self-test (BIST): We include built-in self-test features in your design, which enables on-chip testing without the use of external test apparatus. This enhances overall testability and lowers test expenses.
- Implementation of boundary scan (JTAG) techniques: To facilitate effective testing of the interconnections between components, our experts employ boundary scan (JTAG) techniques. This makes it simpler to debug and identify any issues.
- Test pattern compression: To minimize test time and increase overall test efficiency, we use test pattern compression techniques to shrink test data. This promotes a quicker time to market and lowers test expenses.
- Fault coverage analysis: To make sure that your design is adequately tested and that any potential flaws are found, our engineers carry out in-depth fault coverage analysis. Your design's overall dependability and quality are enhanced by this robust method.
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